Download Advances in strength of materials : selected peer reviewed by Liviu Marsavina PDF

By Liviu Marsavina

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Extra info for Advances in strength of materials : selected peer reviewed papers from the Strength of Materials Laboratory at 85 years, 21-22 November 2008, Timisoara, Romania

Example text

Less light is passed with this filter, but the fringe envelope is larger. This filter can be use for VSI measurements of greater than 3x speed. The mode Vertical Scanning Interferometry (VSI) uses a broad- band light source. It measures objects with rough surfaces and those with adjacent pixels-height differences greater than λ/4. However it yields precision in the nanometer range, rather than in the subnanometer range, as does PSI. The measurements taken with the interferometer light microscope presents an important advantage: it represents a real 3D measurement.

There is no constraint free crack to grow applying CDF, which opens the crack, but higher CDF must be applied to extend surface and embedded cracks. The next step is how to detect crack in a structural component by available NDT methods, using its proper capacity and sensitivity. Anyhow, it is still not clear what size of a crack can be detected by selected method. Therefore, it is not far from reality to say that many structures are introduced in service with undetected cracks. In general, these cracks are introduced with material itself, for example as manufacturing defect (plate rolling, welding, forging, casting).

With this in mind, it is necessary first to define what is the crack in a structure. Planar discontinuity in material can be considered as a crack. The crack is presented by two surfaces in close contact, but without cohesion, e. g. without atomic forces between the surface atoms. Crack is defined in standards, main classification being to free (through), surface and embedded cracks (Fig. 4). There is no constraint free crack to grow applying CDF, which opens the crack, but higher CDF must be applied to extend surface and embedded cracks.

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